Tan spot, caused by Pyrenophora tritici-repentis, is a major foliar disease of wheat worldwide. Host plant resistance is the best strategy to manage this disease. Traditionally, bi-parental mapping populations have been used to identify and map quantitative trait loci (QTL) affecting tan spot resistance in wheat.
Tan spot, a major foliar disease of wheat (Triticum aestivum L.), is caused by an ascomycetePyrenophora tritici-repentis. Both culture filtrates and conidiospore inocula induce disease symptoms in susceptible wheat genotypes. The objectives of this study were to determine and map the genetic control of resistance to spore inocula and culture filtrates of P. tritici-repentis races 2 and 5. The F1 and F2 generations and an F2:6 recombinant inbred lines (RIL) population were developed from a cross between the resistant ND 735 and the susceptible Steele-ND.